A computational study probing how different morphologies can result in anisotropic scattering from isotropic films has been published in the Journal of Synchrotron Radiation entitled “Origins of polarization-dependent anisotropic X-ray scattering from organic thin films.” This work will enable definitive interpretations of X-ray scattering experiments on our films based on conjugated polymers toward quantitative measurements of molecular orientation within nanostructures.