{"id":2951,"date":"2025-03-21T11:31:59","date_gmt":"2025-03-21T18:31:59","guid":{"rendered":"https:\/\/labs.wsu.edu\/mccloy\/?page_id=2951"},"modified":"2025-03-21T11:31:59","modified_gmt":"2025-03-21T18:31:59","slug":"electron_microscope","status":"publish","type":"page","link":"https:\/\/labs.wsu.edu\/mccloy\/electron_microscope\/","title":{"rendered":"JSM-IT800 SEM"},"content":{"rendered":"
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JEOL JSM-IT800HL<\/strong><\/span><\/p>\n

Scanning Electron Microscope<\/p>\n

The JEOL IT800 is a Field Emission SEM with a Hybrid Lens which allows imaging of nonconductive or magnetic samples, without the need for a conductive coating, as well as high depth of focus imaging. Beam Deceleration mode improves signal to noise and resolution with accelerating voltage as low as 10 V. The IT800 also comes with a sample transfer cell to transfer sensitive samples between the SEM and a glovebox without exposing to atmosphere.<\/td>\n

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Basic specification:<\/p>\n
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  • Magnification range: 10 – 2,000,000 X<\/li>\n
  • Acceleration voltage: 0.01 to 30 kV<\/li>\n
  • Probe current: ~1 pA to 300 nA<\/li>\n
  • Secondary electron imaging resolution:\n
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    • 7 nm at 20 kV<\/li>\n
    • 3 nm at 1 kV<\/li>\n<\/ul>\n<\/li>\n
    • BSE resolution:\n
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      • 5 nm at 30 kV<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n<\/td>\n
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The IT800 is equipped with a number of different detectors:<\/p>\n